| Original language | English |
|---|---|
| Pages (from-to) | 105-112 |
| Journal | Journal of Electronics and Computer Science |
| Volume | 10 |
| Issue number | 2 |
| Publication status | Published - 2008 |
A Concept Lattice Approach for Model-based Test Suite Reduction
R.Y.K. Fung, P. Ng
Research output: Contribution to journal › Article › peer-review