An incremental approach for model-based test suite reduction using Formal Concept Analysis

Pin Ng, Richard Y.K. Fung

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Model-based test suite reduction aims to provide a smaller set of test scenarios which can preserve the original test coverage with respect to some testing criteria. We are proposing to apply Formal Concept Analysis (FCA) in analyzing the association between a set of test scenarios with a set of transitions specified in a state machine model. By utilizing the properties of concept lattice, we are able to incrementally determine a minimal set of test scenarios with adequate test coverage.

Original languageEnglish
Title of host publicationProceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009
DOIs
Publication statusPublished - 2009
Event4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009 - Fukuoka, Japan
Duration: 20 Dec 200922 Dec 2009

Publication series

NameProceedings of the 4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009

Conference

Conference4th International Conference on Ubiquitous Information Technologies and Applications, ICUT 2009
Country/TerritoryJapan
CityFukuoka
Period20/12/0922/12/09

Keywords

  • Formal concept analysis
  • Incremental test suite reduction
  • Model-based testing
  • State machine model

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