TY - GEN
T1 - Model-based test suite reduction with concept lattice
AU - Ng, Pin
AU - Fung, Richard Y.K.
PY - 2008
Y1 - 2008
N2 - Model-based testing refers to deriving a suite of test cases from a model that represents the behavior of a software system. As there may be large, sometimes infinite, number of operational scenarios that could be generated from a given model, an important issue of model-based testing is to determine a minimal set of test cases which provides sufficient test coverage. With Formal Concept Analysis (FCA) mechanism, we could analyze the coverage of the test cases and eliminate those redundant ones. This systematic approach can help reduce the test suite whilst still maintain the sufficiency of test coverage.
AB - Model-based testing refers to deriving a suite of test cases from a model that represents the behavior of a software system. As there may be large, sometimes infinite, number of operational scenarios that could be generated from a given model, an important issue of model-based testing is to determine a minimal set of test cases which provides sufficient test coverage. With Formal Concept Analysis (FCA) mechanism, we could analyze the coverage of the test cases and eliminate those redundant ones. This systematic approach can help reduce the test suite whilst still maintain the sufficiency of test coverage.
UR - http://www.scopus.com/inward/record.url?scp=61649088688&partnerID=8YFLogxK
U2 - 10.1109/ASEA.2008.27
DO - 10.1109/ASEA.2008.27
M3 - Conference contribution
AN - SCOPUS:61649088688
SN - 9780769534329
T3 - Proceedings of the 2008 Advanced Software Engineering and its Applications, ASEA 2008
SP - 3
EP - 8
BT - Proceedings of the 2008 Advanced Software Engineering and its Applications, ASEA 2008
T2 - 2008 Advanced Software Engineering and its Applications, ASEA 2008
Y2 - 13 December 2008 through 15 December 2008
ER -